Limits to Performance Improvement Provided by Balanced Interferometers and Balanced Detection in OCT/OCM Instruments

We compare the dynamic range of OCT/OCM instruments configured with unbalanced interferometers, e.g., Michelson interferometers, with that of instruments utilizing balanced interferometers and balanced photodetection. We define the dynamic range (DR) as the ratio of the maximum fringe amplitude achieved with a highly reflecting surface to the root-mean-square (rms) noise. Balanced systems achieve a dynamic range 2.5 times higher than that of a Michelson interferometer, enabling an image acquisition speed roughly 6 times faster. This maximum improvement occurs at light source powers of a few milliwatts. At light source powers higher than 30 mW, the advantage in acquisition speed of balanced systems is reduced to a factor of 4. For video-rate imaging, the increased cost and complexity of a balanced system may be outweighed by the factor of 4 to 6 enhancement in image acquisition speed. We include in our analysis the beat-noise resulting from incoherent fight backscattered from the sample, which reduces the advantage of balanced systems. We attempt to resolve confusion surrounding the origin and magnitude of beat-noise , first described by L. Mandel in 1962. Beat-noise is present in both balanced and unbalanced OCT/OCM instruments

Role of Beat Noise in Limiting the Sensitivity of Optical Coherence Tomography

The sensitivity and dynamic range of optical coherence tomography (OCT) are calculated for instruments utilizing two common interferometer configurations and detection schemes. Previous researchers recognized that the performance of dual-balanced OCT instruments is severely limited by beat noise, which is generated by incoherent light backscattered from the sample. However, beat noise has been ignored in previous calculations of Michelson OCT performance. Our measurements of instrument noise confirm the presence of beat noise even in a simple Michelson interferometer configuration with a single photodetector. Including this noise, we calculate the dynamic range as a function of OCT light source power, and find that instruments employing balanced interferometers and balanced detectors can achieve a sensitivity up to six times greater than those based on a simple Michelson interferometer, thereby boosting image acquisition speed by the same factor for equal image quality. However, this advantage of balanced systems is degraded for source powers greater than a few milliwatts. We trace the concept of beat noise back to an earlier paper [J. Opt. Soc. Am. 52, 1335 (1962)]

Modern microwave methods in solid state inorganic materials chemistry: from fundamentals to manufacturing

No abstract available

STM imaging of symmetry-breaking structural distortion in the Bi-based cuprate superconductors

A complicating factor in unraveling the theory of high-temperature (high-Tc) superconductivity is the presence of a "pseudogap" in the density of states, whose origin has been debated since its discovery [1]. Some believe the pseudogap is a broken symmetry state distinct from superconductivity [2-4], while others believe it arises from short-range correlations without symmetry breaking [5,6]. A number of broken symmetries have been imaged and identified with the pseudogap state [7,8], but it remains crucial to disentangle any electronic symmetry breaking from pre-existing structural symmetry of the crystal. We use scanning tunneling microscopy (STM) to observe an orthorhombic structural distortion across the cuprate superconducting Bi2Sr2Can-1CunO2n+4+x (BSCCO) family tree, which breaks two-dimensional inversion symmetry in the surface BiO layer. Although this inversion symmetry breaking structure can impact electronic measurements, we show from its insensitivity to temperature, magnetic field, and doping, that it cannot be the long-sought pseudogap state. To detect this picometer-scale variation in lattice structure, we have implemented a new algorithm which will serve as a powerful tool in the search for broken symmetry electronic states in cuprates, as well as in other materials.Comment: 4 figure

Nanoscale thermal imaging of VO₂ via Poole–Frenkel conduction

We present a method for nanoscale thermal imaging of insulating thin films using atomic force microscopy (AFM), and we demonstrate its utility on VO2. We sweep the applied voltage V to a conducting AFM tip in contact mode and measure the local current I through the film. By fitting the IV curves to a Poole-Frenkel conduction model at low V, we calculate the local temperature with spatial resolution better than 50 nm using only fundamental constants and known film properties. Our thermometry technique enables local temperature measurement of any insulating film dominated by the Poole-Frenkel conduction mechanism and can be extended to insulators that display other conduction mechanisms. © 2022 Author(s).11Nsciescopu